DEVELOPMENT AND RESEARCH OF A LABORATORY SETUP FOR INVESTIGATION OF OPTICAL PROPERTIES OF THIN FILMS
Karasev Nikita Yurievich1, Kostrin Dmitry Konstantinovich2
1Saint Petersburg state electrotechnical university, student of department of electronic devices and instruments
2Saint Petersburg state electrotechnical university, scientific supervisor, candidate of technical sciences, associate professor of department of electronic devices and instruments
AbstractIn this article the development of a laboratory setup for investigation of optical properties of thin films by spectral interferometry with further study of the possibility of using an additional source of radia-tion, having a spectrum distinct from an incandescent lamp, is considered. Reflectance spectrums of films obtained using different radiation sources are shown.Keywords: radiation source, spectral interferometry, spectrometer, thin films
Category: 05.00.00 Technical sciences
Article reference:
Development and research of a laboratory setup for investigation of optical properties of thin films // Modern scientific researches and innovations. 2015. № 10 [Electronic journal]. URL: https://web.snauka.ru/en/issues/2015/10/57814
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