DEVELOPMENT AND RESEARCH OF A LABORATORY SETUP FOR INVESTIGATION OF OPTICAL PROPERTIES OF THIN FILMS

Karasev Nikita Yurievich1, Kostrin Dmitry Konstantinovich2
1Saint Petersburg state electrotechnical university, student of department of electronic devices and instruments
2Saint Petersburg state electrotechnical university, scientific supervisor, candidate of technical sciences, associate professor of department of electronic devices and instruments

Abstract
In this article the development of a laboratory setup for investigation of optical properties of thin films by spectral interferometry with further study of the possibility of using an additional source of radia-tion, having a spectrum distinct from an incandescent lamp, is considered. Reflectance spectrums of films obtained using different radiation sources are shown.

Keywords: radiation source, spectral interferometry, spectrometer, thin films


Category: 05.00.00 Technical sciences

Article reference:
Development and research of a laboratory setup for investigation of optical properties of thin films // Modern scientific researches and innovations. 2015. № 10 [Electronic journal]. URL: https://web.snauka.ru/en/issues/2015/10/57814

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